gtl_5050_header

 

gtl_three_pictures3

    The  Model 5050 Probing System, designed by signal integrity (SI) engineers, is the first system that lets you probe a wide variety of three-dimensional and two-sided test structures from BGA packages to large emulation boards. Unlike other lab bench signal integrity probing solutions, the GTL 5050 uses a rotating platform that is mounted on a rigid steel pedestal base. The test structure is securely fixed on the rotating platform, allowing you to perform probing on each side of the board, with ample room for multiple positioners.

gtl_rotating_mark

Key Features-

  • Three-dimensional and planar structures
  • Test boards up to 30 inches by 20 inches
  • Handles multiple board interconnects, BGA packages, Test Sockets, Contactors, and more
  • Micro-CCD camera option offers visual access and probe placement in confined spaces
  • Joy-stick controlled remote positioners for precise bottom-side probe placement
  • Accomodates multiple probe positioners for complex Agressor/victim measurements

Yes, I want to learn more about the innovative 5050 System  -  Send me:

  GTL 5050 Product Brochure
  contact me to discuss my application
   App Note 105 Two_Tier Deembedding
   

 Gigatest Labs Engineering Services Brochure

  
First Name: 
Last Name: 
Company: 
e-Mail: