

The Model 5050 Probing System, designed by signal integrity (SI) engineers, is the first system that lets you probe a wide variety of three-dimensional and two-sided test structures from BGA packages to large emulation boards. Unlike other lab bench signal integrity probing solutions, the GTL 5050 uses a rotating platform that is mounted on a rigid steel pedestal base. The test structure is securely fixed on the rotating platform, allowing you to perform probing on each side of the board, with ample room for multiple positioners.

Key Features-
Three-dimensional and planar structures
Test boards up to 30 inches by 20 inches
Handles multiple board interconnects, BGA packages, Test Sockets, Contactors, and more
Micro-CCD camera option offers visual access and probe placement in confined spaces
Joy-stick controlled remote positioners for precise bottom-side probe placement
Accomodates multiple probe positioners for complex Agressor/victim measurements
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